Mpi.com.tw Website Review

MPI | Probe Cards | Wafer Probe Cards | Probe Card | Probe Card Manufacturer | Cantilever Probe Cards | Vertical Probe Card | RF Probe Card | Parametric Probe Card | Probe Card Design | ProbeCard | 300mm Probe Cards | Wafer Sort Probe Card

MPI Probe Cards are a proven solution for a variety of semiconductor production tests including on wafer high volume manufacturing (HVM). Based on improved “Buckling Beam” technology – Cobra , the cards are adapted for bond pad patterns such as full array,semi-array,peripheral and staggered – chip pattern. MPI’s technology has the world best overall cost-of-ownership (COO) for the following DUT packages : Probe Card Design. MPI MEMS-based probe cards| Probe Cards | Probe Card Manufacturer | Cantilever Probe Cards | Vertical Probe Card | RF Probe Card | Wafer Probe Cards | Parametric Probe Card | Probe Card Design | 300mm Probe Cards | Probe Cards | Probe Card | Probe Card Manufacturer | Cantilever Probe Cards | Vertical Probe Card | RF Probe Card | Wafer Probe Cards | Parametric Probe Card | Probe Card Design | 150mm Probe Cards | SOC | 200mm Probe Cards | MEMS Probe Card | Fine Pitch Probe Card | Wafer Probe Card | Semiconductor Wafer Probe Card | Probe Technology | Wafer Sort Probe Card

Probe Card Types |  Probe Card  |  LCD Driver Probe Card |  Logic Probe Card |  Parametric Probe Card  |  Vertical Probe Cards |  Cantilever Probe Cards  

LED Test | LED Testing | LED Testing System | LED Wafer Test | LED Wafer Sorter | LED Optical Measurement | Automated Optical Inspection | LED Wafer Sorter | LED Wafer Probe | LED chip testing | Photonics Automation

For general LED chip and package testing, MPI PA division offers LEDA T200 for LED chip testing and T100 for package testing. The LEDA brand prober configurations include wafer level, tape level and die level device probing. In LED chip process, the LEDA brand AOI systems specialize in defects ysis after probing/sorting.

先進的半導體測試| 探針台| 晶圓探針台| 探測站| 半導體探針系統| 半導體晶圓測試| 微操縱器| 探針台製造商| 探針台微操縱器 | Advanced Semiconductor Test | Probe Stations | Wafer Probe Stations| Probe Station | Semiconductor Probe Systems | Semiconductor Wafer Test | Micromanipulators | Probe Station Manufacturers | Probe Station Micromanipulator

MPI AST提供完整的晶圓焊盤探測解決方案，基於各種工程探針台，26至110 GHz的RF探頭和RF校準軟件QAlibria®。 RF晶片探針將沿同軸電纜傳播的電磁能轉換為晶片上DUT及其接觸墊。 轉換必須以最小的失真和能量損失進行。MPI。 半導體測試設備。 先進的半導體測試| 探針台| 晶圓探針台| 探測站| 半導體探針系統| 半導體晶圓測試| 微操縱器| 探針台製造商| 探針台微操縱器

Temperature Conditioning Systems | Environmental Test Chambers | Temperature Test Systems | Thermal Stream | Thermal Testing | Temperature Profiling | Thermal Air Stream

ThermalAir TA-5000 temperature testing equipment and chambers can thermal test any electronic, electromechanical, and non-electronic components at wide temperature ranges to meet your application requirements.

 Applications & Industry Segments

Thermal Test Semiconductor Components

Semiconductor

MPI | MPI Corporation | MPI Probe Cards | MPI Thermal | MPI Advanced Semiconductor Test | MPI Test | MPI USA | MPI Taiwan

MPI Corporation was founded in July, 1995 and has enjoyed growth well beyond the industry standard due to an infusion between customer centricity, the latest technology development, advanced manufacturing techniques and world cl customer support. In addition, having four vertical markets spanning across many different industries has enabled MPI steady growth. MPI’s four main product markets include state of the art Probe Cards, Production LED Equipment, Advanced Semiconductor Test Equipment and Eco-minded Thermal Products. We are MPI!